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集成電路封裝材料的表征

集成電路封裝材料的表征

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作 者: (美)布倫德爾,埃文斯,摩爾
出版社: 哈爾濱工業(yè)大學(xué)出版社
叢編項(xiàng): 材料表征原版系列叢書
標(biāo) 簽: 暫缺

ISBN: 9787560342825 出版時(shí)間: 2014-01-01 包裝:
開本: 16開 頁(yè)數(shù): 字?jǐn)?shù):  

內(nèi)容簡(jiǎn)介

  《集成電路封裝材料的表征(英文)》的主要內(nèi)容包括: Foreword;Preface to the Reissue of the Materials Characterization Series xiii;Preface to Series xiv;Preface to the Reissue of Integrated Circuit Packaging Materials xv;Preface xvi;Contributors xix等。

作者簡(jiǎn)介

暫缺《集成電路封裝材料的表征》作者簡(jiǎn)介

圖書目錄

Foreword xi
Preface to the Reissue of the Materials Characterization Series xiii
Preface to Series xiv
Preface to the Reissue of Integrated Circuit Packaging Materials xv
Preface xvi
Contributors xix
IC PACKAGE RELIABILITY TESTING
MOLD COMPOUND ADHESION AND STRENGTH
MECHANICAL STRESS IN IC PACKAGES
MOISTURE SENSITMTY AND DELAMINATION
THERMAL MANAGEMENT
ELECTRICAL PERFORMANCE OF IC PACKAGES
SOLDERABILITY OF INTEGRATED CIRCUITS
HERMETICITY AND JOINING IN CERAMIC IC PACKAGES
ADVANCED INTERCONNECT TECHNOLOGY
APPENDIX: TECHNIQUE SUMMARIES

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